MULTI OPTICAL AXIES ARRANGE INSPECTION DEVICE AND AXIES ARRANGING METHOD THEREOF

An apparatus for inspecting the axis arrangement of a multi-axis optical system comprises: a common target block (10) which forms a target from different wavelength bands; and an arc-shaped scope block (20) which reflects light in parallel toward an inspection optical device (100) where optical axis...

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Bibliographische Detailangaben
Hauptverfasser:	YOON, JOO HONG, KWAK, DONG MIN, KIM, HAN KYONG, SUNG, GI YEUL, YOON, BYEONG SEON
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	An apparatus for inspecting the axis arrangement of a multi-axis optical system comprises: a common target block (10) which forms a target from different wavelength bands; and an arc-shaped scope block (20) which reflects light in parallel toward an inspection optical device (100) where optical axis error arrangement is performed in order to form a path without any influence of parallax. The apparatus can inspect the optical axis arrangement of a multi-wavelength complex optical system by obtaining a central pixel position coordinate of a cross line based on the target for band 1 and band 2 images obtained from the inspection optical device (100), and then by calculating an arrangement error of two optical systems from a known field of view (FOV) and the number of pixels on a displayer, and can be easily manufactured at low prices and with mobility.