APPARATUS FOR INSPECTING PANEL

APPARATUS FOR INSPECTING PANEL

An apparatus for inspecting a panel is disclosed. According to an embodiment of the present invention, the apparatus for inspecting a panel comprises a device table to where a panel to be inspected and attached with a functional film is transferred; a functional film/panel adhesion inspecting unit w...

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Hauptverfasser: JUNG, JAE HOON, KIM, JEONG KU, JUNG, SUNG WHA, YEO, IN TACK, LEE, YONG JU
Format: Patent
Sprache:eng ; kor
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator JUNG, JAE HOON
KIM, JEONG KU
JUNG, SUNG WHA
YEO, IN TACK
LEE, YONG JU
description An apparatus for inspecting a panel is disclosed. According to an embodiment of the present invention, the apparatus for inspecting a panel comprises a device table to where a panel to be inspected and attached with a functional film is transferred; a functional film/panel adhesion inspecting unit which is placed at one side of the device table in order to detect the adhesion of the functional film to the panel; and a panel defect inspection unit which is placed at the other side of the device table in order to detect the existence of a foreign material or a defective protrusion on the panel.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title APPARATUS FOR INSPECTING PANEL
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