APPARATUS FOR INSPECTING PANEL

An apparatus for inspecting a panel is disclosed. According to an embodiment of the present invention, the apparatus for inspecting a panel comprises a device table to where a panel to be inspected and attached with a functional film is transferred; a functional film/panel adhesion inspecting unit w...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	JUNG, JAE HOON, KIM, JEONG KU, JUNG, SUNG WHA, YEO, IN TACK, LEE, YONG JU
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An apparatus for inspecting a panel is disclosed. According to an embodiment of the present invention, the apparatus for inspecting a panel comprises a device table to where a panel to be inspected and attached with a functional film is transferred; a functional film/panel adhesion inspecting unit which is placed at one side of the device table in order to detect the adhesion of the functional film to the panel; and a panel defect inspection unit which is placed at the other side of the device table in order to detect the existence of a foreign material or a defective protrusion on the panel.