DEVICE AND METHOD FOR TESTING MEASURING SENSOR

DEVICE AND METHOD FOR TESTING MEASURING SENSOR

A device for testing a measuring sensor according to an embodiment of the present invention includes a first test device disposed on one end of a current line which is connected between the measuring sensor and a electrical space, and transmitting a command signal for testing line characteristics of...

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Hauptverfasser: KIM, WOONG, BANG, CHANG IL, LEE, JOUNG HAN
Format: Patent
Sprache:eng ; kor
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SIGNALLING
TESTING
TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS
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creator KIM, WOONG
BANG, CHANG IL
LEE, JOUNG HAN
description A device for testing a measuring sensor according to an embodiment of the present invention includes a first test device disposed on one end of a current line which is connected between the measuring sensor and a electrical space, and transmitting a command signal for testing line characteristics of the current line by operating the device with a master; and a second test device disposed on the other end of the current line and performing a line characteristics test based on the command signal by operating the device with a slave. [Reference numerals] (101) Measuring sensor; (102) Electrical space; (110) First test device; (120) Second test device; (AA) Current loop
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SIGNALLING
TESTING
TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS
title DEVICE AND METHOD FOR TESTING MEASURING SENSOR
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