DEVICE AND METHOD FOR TESTING MEASURING SENSOR

A device for testing a measuring sensor according to an embodiment of the present invention includes a first test device disposed on one end of a current line which is connected between the measuring sensor and a electrical space, and transmitting a command signal for testing line characteristics of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KIM, WOONG, BANG, CHANG IL, LEE, JOUNG HAN
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SIGNALLING TESTING TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS
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Beschreibung
Zusammenfassung:	A device for testing a measuring sensor according to an embodiment of the present invention includes a first test device disposed on one end of a current line which is connected between the measuring sensor and a electrical space, and transmitting a command signal for testing line characteristics of the current line by operating the device with a master; and a second test device disposed on the other end of the current line and performing a line characteristics test based on the command signal by operating the device with a slave. [Reference numerals] (101) Measuring sensor; (102) Electrical space; (110) First test device; (120) Second test device; (AA) Current loop