PRODUCTION MANAGEMENT APPARATUS AND PRODUCTION MANAGEMENT SYSTEM FOR ELECTRONIC DEVICE, AND STORAGE MEDIUM

According to embodiments of the present invention, a production management apparatus of an electronic device is provided. The production management apparatus generates a model function using a database relating to a relationship between a characteristic of a manufactured component and a manufacturing condition value of a component of the electronic device, and determines a first manufacturing condition value. A squared prediction error is calculated using a measured value of the characteristic when actually forming the component using the determined first manufacturing condition value. If the squared prediction error is greater than a reference value, the first manufacturing condition value is to be a second manufacturing condition value of the next electronic device without correcting the model function. If the squared prediction error is not more than the reference value, a second model function is generated using a database in which a value at the actual formation of the component is added , and a second manufacturing condition value is determined based on the second model function.