JIG FOR MEASURING EMC OF SEMICONDUCTOR CHIP AND METHOD FOR MEASURING EMC OF SEMICONDUCTOR CHIP USING THE SAME

JIG FOR MEASURING EMC OF SEMICONDUCTOR CHIP AND METHOD FOR MEASURING EMC OF SEMICONDUCTOR CHIP USING THE SAME

PURPOSE: A jig for measuring the electro-magnetic compatibility (EMC) of a semiconductor chip and an EMC measuring method using the same are provided to measure the EMC of the semiconductor chip in various operating environments. CONSTITUTION: A jig for measuring the EMC of a semiconductor chip incl...

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1. Verfasser: YEO, SOON IL
Format: Patent
Sprache:eng ; kor
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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description PURPOSE: A jig for measuring the electro-magnetic compatibility (EMC) of a semiconductor chip and an EMC measuring method using the same are provided to measure the EMC of the semiconductor chip in various operating environments. CONSTITUTION: A jig for measuring the EMC of a semiconductor chip includes a memory unit (203) of the jig. A memory unit of the jig includes a normal data storage unit (301), an EMC data storage unit (303), a measuring data storage unit (305), and a data selective output unit (307). The normal data storage unit stores necessary information for the normal function test of a semiconductor chip. The EMC data storage unit stores the EMC information of components within a system according to various operating situations of the system in a data base (DB). The data selective output unit provides the information stored in the EMC data storage unit or the normal data storage unit to a chip mount unit. [Reference numerals] (201) Chip mount unit; (301) Normal data storage unit; (303) EMC data storage unit; (305) Measuring data storage unit; (AA) Data selective output unit; (BB) Memory unit
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title JIG FOR MEASURING EMC OF SEMICONDUCTOR CHIP AND METHOD FOR MEASURING EMC OF SEMICONDUCTOR CHIP USING THE SAME
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