JIG FOR MEASURING EMC OF SEMICONDUCTOR CHIP AND METHOD FOR MEASURING EMC OF SEMICONDUCTOR CHIP USING THE SAME

PURPOSE: A jig for measuring the electro-magnetic compatibility (EMC) of a semiconductor chip and an EMC measuring method using the same are provided to measure the EMC of the semiconductor chip in various operating environments. CONSTITUTION: A jig for measuring the EMC of a semiconductor chip includes a memory unit (203) of the jig. A memory unit of the jig includes a normal data storage unit (301), an EMC data storage unit (303), a measuring data storage unit (305), and a data selective output unit (307). The normal data storage unit stores necessary information for the normal function test of a semiconductor chip. The EMC data storage unit stores the EMC information of components within a system according to various operating situations of the system in a data base (DB). The data selective output unit provides the information stored in the EMC data storage unit or the normal data storage unit to a chip mount unit. [Reference numerals] (201) Chip mount unit; (301) Normal data storage unit; (303) EMC data storage unit; (305) Measuring data storage unit; (AA) Data selective output unit; (BB) Memory unit