APPARATUS FOR AUTOMATED OPTICAL INSPECTION

PURPOSE: A vision device and an automatic visual inspecting device with the same are provided to effectively inspect fine patterns formed on a PCB and normal patterns which are larger than the fine patterns while minimizing an excessive inspection and an incomplete inspection by integrating modules...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KIM, YOUNG JAE, JANG, JI SANG, DO, YOUNG KY, JEON, SEUNG HO, PARK, MIN HO, OH, KAB KEUN, BAE, MYUNG HYUN
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PRINTED CIRCUITS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE: A vision device and an automatic visual inspecting device with the same are provided to effectively inspect fine patterns formed on a PCB and normal patterns which are larger than the fine patterns while minimizing an excessive inspection and an incomplete inspection by integrating modules with various functions into one device. CONSTITUTION: A vision device comprises a vision unit(300) and a supporting unit. The vision unit inspects a target substrate(S). The supporting unit is arranged in the lower part of the vision unit by being spaced and supports the front or rear surface of the target substrate. The supporting unit includes a side supporting unit supporting an edge of the target substrate and a center supporting unit supporting a central portion of the target substrate.