PLASMA REACTOR HAVING DUAL INDUCTIVELY COUPLED PLASMA SOURCE
PURPOSE: A plasma reactor including a dual induction coupling plasma source is provided to effectively execute a bosh process by uniformly processing a wafer substrate. CONSTITUTION: A plasma reactor(10) includes a plasma reactor body(12) and a dual induction coupling plasma source(20). The plasma r...
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Format: | Patent |
Sprache: | eng ; kor |
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Zusammenfassung: | PURPOSE: A plasma reactor including a dual induction coupling plasma source is provided to effectively execute a bosh process by uniformly processing a wafer substrate. CONSTITUTION: A plasma reactor(10) includes a plasma reactor body(12) and a dual induction coupling plasma source(20). The plasma reactor includes a substrate processing area and a dielectric window which touches the substrate processing area. The dual induction coupling plasma source includes a first antenna providing a first induced electromotive force for generating plasma in a core area of a substrate processing area through a dielectric window and a second antenna providing a second induced electromotive force for generating the plasma in a boundary area of the substrate processing area. The dual induction coupling plasma source repetitively executes an evaporation process and an engraving process and generates a penetrated silicon path for a processed substrate. [Reference numerals] (42,46,52) Impedance matcher; (60) Vacuum pump |
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