PROBE AND APPARATUS FOR TEST OF ELECTORNIC DEVICE USING THE SAME

PURPOSE: A probe and an electronic component test apparatus using the same are provided to prevent damage to electronic components by suppressing the rotation of a probe tip. CONSTITUTION: A probe includes a probe tip(32), a fixing block(34), and an adhesive component(38). One end of the probe tip t...

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Bibliographische Detailangaben
1. Verfasser:	JUNG, JONG SUK
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PURPOSE: A probe and an electronic component test apparatus using the same are provided to prevent damage to electronic components by suppressing the rotation of a probe tip. CONSTITUTION: A probe includes a probe tip(32), a fixing block(34), and an adhesive component(38). One end of the probe tip touches an electronic component. The probe tip penetrates the fixing block through an insertion hole formed inside the fixing block and is fixed in the fixing block. The adhesive component locks the probe tip and the fixing block together. The fixing block is equipped with at least one auxiliary hole, and the adhesive component put into the auxiliary hole fixes the fixing block and the probe tip to each other.