POWER SEMICONDUCTOR DEVICE

PURPOSE: A power semiconductor device is provided to improve short circuit ruggedness and improve a breakdown voltage property. CONSTITUTION: A common gate electrode(121) is formed around a semiconductor substrate(110). A first trench is connected to the common gate electrode. A first gate electrode...

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Hauptverfasser: KIM, WEON CHAN, SONG, IN HYUK
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creator KIM, WEON CHAN
SONG, IN HYUK
description PURPOSE: A power semiconductor device is provided to improve short circuit ruggedness and improve a breakdown voltage property. CONSTITUTION: A common gate electrode(121) is formed around a semiconductor substrate(110). A first trench is connected to the common gate electrode. A first gate electrode is filled in the first trench and is connected to the common gate electrode. A second trench(141) is formed in parallel to the first trench. A second gate electrode(142) is electrically separated from the common gate electrode.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20120108680A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20120108680A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20120108680A3</originalsourceid><addsrcrecordid>eNrjZJAK8A93DVIIdvX1dPb3cwl1DvEPUnBxDfN0duVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQUYGhkBkYGFmYeBoTJwqAL45ITE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>POWER SEMICONDUCTOR DEVICE</title><source>esp@cenet</source><creator>KIM, WEON CHAN ; SONG, IN HYUK</creator><creatorcontrib>KIM, WEON CHAN ; SONG, IN HYUK</creatorcontrib><description>PURPOSE: A power semiconductor device is provided to improve short circuit ruggedness and improve a breakdown voltage property. CONSTITUTION: A common gate electrode(121) is formed around a semiconductor substrate(110). A first trench is connected to the common gate electrode. A first gate electrode is filled in the first trench and is connected to the common gate electrode. A second trench(141) is formed in parallel to the first trench. A second gate electrode(142) is electrically separated from the common gate electrode.</description><language>eng ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20121005&amp;DB=EPODOC&amp;CC=KR&amp;NR=20120108680A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20121005&amp;DB=EPODOC&amp;CC=KR&amp;NR=20120108680A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIM, WEON CHAN</creatorcontrib><creatorcontrib>SONG, IN HYUK</creatorcontrib><title>POWER SEMICONDUCTOR DEVICE</title><description>PURPOSE: A power semiconductor device is provided to improve short circuit ruggedness and improve a breakdown voltage property. CONSTITUTION: A common gate electrode(121) is formed around a semiconductor substrate(110). A first trench is connected to the common gate electrode. A first gate electrode is filled in the first trench and is connected to the common gate electrode. A second trench(141) is formed in parallel to the first trench. A second gate electrode(142) is electrically separated from the common gate electrode.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAK8A93DVIIdvX1dPb3cwl1DvEPUnBxDfN0duVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQUYGhkBkYGFmYeBoTJwqAL45ITE</recordid><startdate>20121005</startdate><enddate>20121005</enddate><creator>KIM, WEON CHAN</creator><creator>SONG, IN HYUK</creator><scope>EVB</scope></search><sort><creationdate>20121005</creationdate><title>POWER SEMICONDUCTOR DEVICE</title><author>KIM, WEON CHAN ; SONG, IN HYUK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20120108680A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2012</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>KIM, WEON CHAN</creatorcontrib><creatorcontrib>SONG, IN HYUK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KIM, WEON CHAN</au><au>SONG, IN HYUK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>POWER SEMICONDUCTOR DEVICE</title><date>2012-10-05</date><risdate>2012</risdate><abstract>PURPOSE: A power semiconductor device is provided to improve short circuit ruggedness and improve a breakdown voltage property. CONSTITUTION: A common gate electrode(121) is formed around a semiconductor substrate(110). A first trench is connected to the common gate electrode. A first gate electrode is filled in the first trench and is connected to the common gate electrode. A second trench(141) is formed in parallel to the first trench. A second gate electrode(142) is electrically separated from the common gate electrode.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title POWER SEMICONDUCTOR DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T06%3A23%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KIM,%20WEON%20CHAN&rft.date=2012-10-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20120108680A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true