APPARATUS FOR TESTING SEMICONDUCTOR MEMORY

PURPOSE: A semiconductor test apparatus is provided to increase the number of test device by sharing a common IO channel with a first semiconductor device and a second semiconductor device. CONSTITUTION: A common control channel is commonly connected to a first semiconductor device(201) and a second...

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Bibliographische Detailangaben
Hauptverfasser:	JUNG, CHOONG MAN, CHO, HYUNG JUN
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PURPOSE: A semiconductor test apparatus is provided to increase the number of test device by sharing a common IO channel with a first semiconductor device and a second semiconductor device. CONSTITUTION: A common control channel is commonly connected to a first semiconductor device(201) and a second semiconductor device(202) and applies a control signal. A first selection channel is connected with the first semiconductor device and applies a first chip selection signal. A second selection channel(213) is connected with the second semiconductor device and applies a second selection signal. A common IO channel is commonly connected with the first semiconductor device and the second semiconductor device. A signal input and output unit activates one either the first chip selection signal or the second chip selection signal.