ATOMIC LAYER DEPOSITED TANTALUM CONTAINING ADHESION LAYER

Apparatus and methods of fabricating an atomic layer deposited tantalum containing adhesion layer within at least one dielectric material in the formation of a metal, wherein the atomic layer deposition tantalum containing adhesion layer is sufficiently thin to minimize contact resistance and maximi...

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Bibliographische Detailangaben
Hauptverfasser: PETERSON BRENNAN L, SPURGIN KERRY, JOHNSTON STEVEN W
Format: Patent
Sprache:eng ; kor
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Zusammenfassung:Apparatus and methods of fabricating an atomic layer deposited tantalum containing adhesion layer within at least one dielectric material in the formation of a metal, wherein the atomic layer deposition tantalum containing adhesion layer is sufficiently thin to minimize contact resistance and maximize the total cross-sectional area of metal, including but not limited to tungsten, within the contact.