SHEAR-LAYER CHUCK FOR LITHOGRAPHIC APPARATUS

A lithographic apparatus is described that comprises a support structure to hold an object. The object may be a patterning device or a substrate to be exposed. The support structure comprises a chuck, on which the object is supported, and an array of shear-compliant elongated elements normal to the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NAYFEH SAMIR A, WILLIAMS MARK EDD, VERDIRAME JUSTIN MATTHEW
Format: Patent
Sprache:eng ; kor
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Beschreibung
Zusammenfassung:A lithographic apparatus is described that comprises a support structure to hold an object. The object may be a patterning device or a substrate to be exposed. The support structure comprises a chuck, on which the object is supported, and an array of shear-compliant elongated elements normal to the chuck and the stage, such that first ends of the elongated elements contact a surface of the chuck and second ends of the elongated elements contact a stage. Through using the array of elongated elements, a transfer of stress between the stage and the chuck is substantially uniform, resulting in minimization of slippage of the object relative to the surface of the chuck during a deformation of the chuck due to the stress.