BUILT OFF TEST APPARATUS

PURPOSE: A built-off test device is provided to test a semiconductor device which is rapidly operated. CONSTITUTION: A frequency multiplying part(310) generates a test clock frequency by multiplying a clock frequency which is inputted from an external test device based on the operation speed of a se...

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Bibliographische Detailangaben
Hauptverfasser:	WOO, CHEOL JONG, BYUN, EUN JO, OH, SE JANG
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES STATIC STORES TESTING
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Beschreibung
Zusammenfassung:	PURPOSE: A built-off test device is provided to test a semiconductor device which is rapidly operated. CONSTITUTION: A frequency multiplying part(310) generates a test clock frequency by multiplying a clock frequency which is inputted from an external test device based on the operation speed of a semiconductor device. A command decoder(320) generates test information by decoding a test signal which is inputted from the external test device based on a test clock frequency. A test executing part(330) determines whether the semiconductor device is in an abnormal state from the test data outputted from the semiconductor device.