INSPECTION CIRCUIT, ELECTRO-OPTIC DEVICE, AND ELECTRONIC APPARATUS

PURPOSE: An inspection circuit, an electro-optic device, and an electronic apparatus are provided to reduce power consumption in used for each test and operation of electro-optical device. CONSTITUTION: An inspection circuit is comprised of a test wire, a connection circuit(163), and a supplying cir...

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Bibliographische Detailangaben
1. Verfasser:	ISHII KENYA
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
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Beschreibung
Zusammenfassung:	PURPOSE: An inspection circuit, an electro-optic device, and an electronic apparatus are provided to reduce power consumption in used for each test and operation of electro-optical device. CONSTITUTION: An inspection circuit is comprised of a test wire, a connection circuit(163), and a supplying circuit. The test wire is electrically connected to a testing device(160) for a pixel. The connection circuit electrically connects the test wire with a data line, and a supplying circuit supplies a control signal. The control signal controls conduction or non-conduction between data line and the test wire with the connection circuit. The supplying circuit is driven by a second power sources supplied from the first terminal and a different second terminal.