METHOD MANUFACTURING OF MOSFET DEVICE

A manufacturing method of the MOSFET device is provided to suppress the diffusion of impurity by forming an ion implantation layer for the diffusion barrier at the lower part of the channel region. A manufacturing method of the MOSFET device injecting the ion within the semiconductor substrate inclu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: KO, MIN GU
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator KO, MIN GU
description A manufacturing method of the MOSFET device is provided to suppress the diffusion of impurity by forming an ion implantation layer for the diffusion barrier at the lower part of the channel region. A manufacturing method of the MOSFET device injecting the ion within the semiconductor substrate includes the step for ion-implanting the P- type impurity into the semiconductor substrate in order to form a channel region(240) in a semiconductor substrate(200); the step for ion-implanting either an oxide or a nitride into the semiconductor substrate in which the channel region is formed in order to form an ion implantation layer(250) for the diffusion barrier at the lower part of the channel region.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20090026596A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20090026596A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20090026596A3</originalsourceid><addsrcrecordid>eNrjZFD1dQ3x8HdR8HX0C3VzdA4JDfL0c1fwd1Pw9Q92cw1RcHEN83R25WFgTUvMKU7lhdLcDMpASWcP3dSC_PjU4oLE5NS81JJ47yAjAwNLAwMjM1NLM0dj4lQBACc2JB4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD MANUFACTURING OF MOSFET DEVICE</title><source>esp@cenet</source><creator>KO, MIN GU</creator><creatorcontrib>KO, MIN GU</creatorcontrib><description>A manufacturing method of the MOSFET device is provided to suppress the diffusion of impurity by forming an ion implantation layer for the diffusion barrier at the lower part of the channel region. A manufacturing method of the MOSFET device injecting the ion within the semiconductor substrate includes the step for ion-implanting the P- type impurity into the semiconductor substrate in order to form a channel region(240) in a semiconductor substrate(200); the step for ion-implanting either an oxide or a nitride into the semiconductor substrate in which the channel region is formed in order to form an ion implantation layer(250) for the diffusion barrier at the lower part of the channel region.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090313&amp;DB=EPODOC&amp;CC=KR&amp;NR=20090026596A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090313&amp;DB=EPODOC&amp;CC=KR&amp;NR=20090026596A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KO, MIN GU</creatorcontrib><title>METHOD MANUFACTURING OF MOSFET DEVICE</title><description>A manufacturing method of the MOSFET device is provided to suppress the diffusion of impurity by forming an ion implantation layer for the diffusion barrier at the lower part of the channel region. A manufacturing method of the MOSFET device injecting the ion within the semiconductor substrate includes the step for ion-implanting the P- type impurity into the semiconductor substrate in order to form a channel region(240) in a semiconductor substrate(200); the step for ion-implanting either an oxide or a nitride into the semiconductor substrate in which the channel region is formed in order to form an ion implantation layer(250) for the diffusion barrier at the lower part of the channel region.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD1dQ3x8HdR8HX0C3VzdA4JDfL0c1fwd1Pw9Q92cw1RcHEN83R25WFgTUvMKU7lhdLcDMpASWcP3dSC_PjU4oLE5NS81JJ47yAjAwNLAwMjM1NLM0dj4lQBACc2JB4</recordid><startdate>20090313</startdate><enddate>20090313</enddate><creator>KO, MIN GU</creator><scope>EVB</scope></search><sort><creationdate>20090313</creationdate><title>METHOD MANUFACTURING OF MOSFET DEVICE</title><author>KO, MIN GU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20090026596A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>KO, MIN GU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KO, MIN GU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD MANUFACTURING OF MOSFET DEVICE</title><date>2009-03-13</date><risdate>2009</risdate><abstract>A manufacturing method of the MOSFET device is provided to suppress the diffusion of impurity by forming an ion implantation layer for the diffusion barrier at the lower part of the channel region. A manufacturing method of the MOSFET device injecting the ion within the semiconductor substrate includes the step for ion-implanting the P- type impurity into the semiconductor substrate in order to form a channel region(240) in a semiconductor substrate(200); the step for ion-implanting either an oxide or a nitride into the semiconductor substrate in which the channel region is formed in order to form an ion implantation layer(250) for the diffusion barrier at the lower part of the channel region.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_KR20090026596A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title METHOD MANUFACTURING OF MOSFET DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T14%3A59%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KO,%20MIN%20GU&rft.date=2009-03-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20090026596A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true