APPARATUS FOR CONTROLLING ABNORMAL SMALL SIGNAL INPUTTED FROM DC UNIT TO MEMORY DEVICE

APPARATUS FOR CONTROLLING ABNORMAL SMALL SIGNAL INPUTTED FROM DC UNIT TO MEMORY DEVICE

An apparatus for controlling an abnormal final signal applied from a DC unit to a memory device is provided to block and control fully the abnormal final signal from the DC unit for measuring a DC parameter of the memory device to the memory device. An apparatus for controlling an abnormal final sig...

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Bibliographische Detailangaben
Hauptverfasser: HYUN, BYUNG CHUL, HEO, JANG UK
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:An apparatus for controlling an abnormal final signal applied from a DC unit to a memory device is provided to block and control fully the abnormal final signal from the DC unit for measuring a DC parameter of the memory device to the memory device. An apparatus for controlling an abnormal final signal includes a first photo-MOS relay(131) and a cut-off switch(134). The first photo-MOS relay controls on/off states of a test signal applied to a memory device(120) in order to measure a DC parameter of the memory device. The cut-off switch is serially connected with the first photo-MOS relay and is connected with the ground.