A SEMICONDUCTOR DEVICE, A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A TESTING METHOD OF THE SAME

A semiconductor device, a method of manufacturing a semiconductor device and a testing method of the same is provided to Integrate the second semiconductor devices selected each process. A manufacturing method of the semiconductor device is comprised of steps: forming a first semiconductor device having first memory circuit(1); performing the electrical test of the first semiconductor device and selects the good(2); forming the second semiconductor device; performing an electrical test of the second memory circuit of second semiconductor device; selecting the good and Integrating the second semiconductor device selected in the fourth process and first semiconductor device selected in the second process.