PROBE TIP AND MANUFACTURING METHOD

A probe tip and a manufacturing method thereof are provided to prevent the other part except for the probe tip from being contacted, in contacting the probe tip with a chip pad and to separate the probe tip formed in a hole, after electro-plating. A probe tip(100) contacts with a pad of an IC(Integr...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KIM, YONG WHAN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!