THE PROBE NEEDLE ABRASIVE SHEET FOR EXAMINATION TO SEMICONDUCTOR

A polishing sheet of a probe needle for inspecting a semiconductor is provided to extend the lifetime of a probe needle by removing the foreign substances attached to the probe needle while sharpening the end of the probe needle. A releasable film(10) of a thin film type is formed in the bottommost...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	YOUN, KYUNG SEOB
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
Online-Zugang:	Volltext bestellen
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