APPARATUS AND METHODS FOR SLURRY CLEANING OF ETCH CHAMBERS
Described are methods of cleaning debris from semiconductor etch chambers or chamber components, one method comprising directing atomized abrasive slurry onto at least some internal surfaces of such a chamber or chamber components. Apparatus for carrying out the methods are also described.
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | Described are methods of cleaning debris from semiconductor etch chambers or chamber components, one method comprising directing atomized abrasive slurry onto at least some internal surfaces of such a chamber or chamber components. Apparatus for carrying out the methods are also described. |
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