REPROGRAMMING OF TESTER RESOURCE ASSIGNMENTS

Reprogramming of tester resource assignment is provided to assign tester resources for a multi-chip package and other packaged devices without changing a test program for testing a wafer. A mapping file is generated. A device test program for testing a device is generated. A package test program for testing an electronic package is generated(440). The electronic package includes the device and the package test program is generated from a source code in the mapping file. A device test program source code includes at least one reference for at least one device pin ID. Each device pin ID identifies a device pin related to the device. Each identified device pin is attached to a package pin related to the electronic package. Each package pin is identified by a package pin ID. The mapping file redefines each device pin ID of the device test program. At least one command converts the device pin ID into the related package pin ID, attaches the tester resource to the package pin ID, and properly activates the test resource in the device test program.