INSPECTION SYSTEM AND METHOD FOR PROVIDING FEEDBACK

An inspection system (100) inspects features of an object (130) using a feedback mechanism. The inspection system (100) includes a processor (150) that receives image data (145 or 165) representing the object (130). The processor (150) is operable to determine parameter modification information (450...

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Bibliographische Detailangaben
Hauptverfasser:	LI JONATHAN QIANG, CHOPRA NASREEN, BAHARAV IZHAK
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS REGULATING TESTING
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Beschreibung
Zusammenfassung:	An inspection system (100) inspects features of an object (130) using a feedback mechanism. The inspection system (100) includes a processor (150) that receives image data (145 or 165) representing the object (130). The processor (150) is operable to determine parameter modification information (450) from the image data (145 or 165) and modify an image parameter (400 or 600) used during the production of the image data (145 or 165) with the parameter modification information (450). The modified image parameter (400 or 600) is used during the production of subsequent image data (145 or 165) representing the object (130).