SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

A semiconductor device according to the present invention comprises an electrode pad electrically conducted to an electric circuit formed on an element-formed surface of a silicon wafer; a wiring pattern re-wired by being electrically conducted to the electrode pad; and an oxide film formed on a sur...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUMINOE SHINJI, MORI KATSUNOBU, IWAZAKI YOSHIHIDE
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A semiconductor device according to the present invention comprises an electrode pad electrically conducted to an electric circuit formed on an element-formed surface of a silicon wafer; a wiring pattern re-wired by being electrically conducted to the electrode pad; and an oxide film formed on a surface of the wiring pattern, the oxide film being formed by subjecting the wiring pattern to oxidization. With the provision of oxide film, the semiconductor device prevents a decrease in reliability in terms of electric characteristic or the like, and also achieves reduction in fabrication cost compared to a conventional semiconductor device.