INSTRUMENT FOR TESTING SOLID-STATE IMAGING DEVICE

A test instrument with high efficiency in which an optical system for illuminating a solid-state imaging device with a test light can be positioned at the solid-state imaging device. The instrument comprises an optical module (35) for illuminating the light-receiving surface of a solid-state imaging...

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1. Verfasser: TAMAI SHINGO
Format: Patent
Sprache:eng
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