INSTRUMENT FOR TESTING SOLID-STATE IMAGING DEVICE

A test instrument with high efficiency in which an optical system for illuminating a solid-state imaging device with a test light can be positioned at the solid-state imaging device. The instrument comprises an optical module (35) for illuminating the light-receiving surface of a solid-state imaging device with light from a light source through a pinhole, a probe card (20) having a contact needle to be brought into contact with a pad of the solid-stage imaging device, and a motor (30) and holding arm (31) for moving the optical module (35) to a predetermined position with respect to the solid-stage imaging device to be tested through an opening (20h) made in the probe card (20) when the contact needle (21) is in contact with a pad of the solid-stage imaging device.