INSTRUMENT FOR TESTING SOLID-STATE IMAGING DEVICE
A test instrument with high efficiency in which an optical system for illuminating a solid-state imaging device with a test light can be positioned at the solid-state imaging device. The instrument comprises an optical module (35) for illuminating the light-receiving surface of a solid-state imaging...
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| creator | TAMAI SHINGO |
| description | A test instrument with high efficiency in which an optical system for illuminating a solid-state imaging device with a test light can be positioned at the solid-state imaging device. The instrument comprises an optical module (35) for illuminating the light-receiving surface of a solid-state imaging device with light from a light source through a pinhole, a probe card (20) having a contact needle to be brought into contact with a pad of the solid-stage imaging device, and a motor (30) and holding arm (31) for moving the optical module (35) to a predetermined position with respect to the solid-stage imaging device to be tested through an opening (20h) made in the probe card (20) when the contact needle (21) is in contact with a pad of the solid-stage imaging device. |
| format | Patent |
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The instrument comprises an optical module (35) for illuminating the light-receiving surface of a solid-state imaging device with light from a light source through a pinhole, a probe card (20) having a contact needle to be brought into contact with a pad of the solid-stage imaging device, and a motor (30) and holding arm (31) for moving the optical module (35) to a predetermined position with respect to the solid-stage imaging device to be tested through an opening (20h) made in the probe card (20) when the contact needle (21) is in contact with a pad of the solid-stage imaging device.</description><edition>7</edition><language>eng</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; MEASURING ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050829&DB=EPODOC&CC=KR&NR=20050085408A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050829&DB=EPODOC&CC=KR&NR=20050085408A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAMAI SHINGO</creatorcontrib><title>INSTRUMENT FOR TESTING SOLID-STATE IMAGING DEVICE</title><description>A test instrument with high efficiency in which an optical system for illuminating a solid-state imaging device with a test light can be positioned at the solid-state imaging device. The instrument comprises an optical module (35) for illuminating the light-receiving surface of a solid-state imaging device with light from a light source through a pinhole, a probe card (20) having a contact needle to be brought into contact with a pad of the solid-stage imaging device, and a motor (30) and holding arm (31) for moving the optical module (35) to a predetermined position with respect to the solid-stage imaging device to be tested through an opening (20h) made in the probe card (20) when the contact needle (21) is in contact with a pad of the solid-stage imaging device.</description><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD09AsOCQr1dfULUXDzD1IIcQ0O8fRzVwj29_F00Q0OcQxxVfD0dXQHibm4hnk6u_IwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUknjvICMDA1MDAwtTEwMLR2PiVAEAARInhw</recordid><startdate>20050829</startdate><enddate>20050829</enddate><creator>TAMAI SHINGO</creator><scope>EVB</scope></search><sort><creationdate>20050829</creationdate><title>INSTRUMENT FOR TESTING SOLID-STATE IMAGING DEVICE</title><author>TAMAI SHINGO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20050085408A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>TAMAI SHINGO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAMAI SHINGO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSTRUMENT FOR TESTING SOLID-STATE IMAGING DEVICE</title><date>2005-08-29</date><risdate>2005</risdate><abstract>A test instrument with high efficiency in which an optical system for illuminating a solid-state imaging device with a test light can be positioned at the solid-state imaging device. The instrument comprises an optical module (35) for illuminating the light-receiving surface of a solid-state imaging device with light from a light source through a pinhole, a probe card (20) having a contact needle to be brought into contact with a pad of the solid-stage imaging device, and a motor (30) and holding arm (31) for moving the optical module (35) to a predetermined position with respect to the solid-stage imaging device to be tested through an opening (20h) made in the probe card (20) when the contact needle (21) is in contact with a pad of the solid-stage imaging device.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY MEASURING PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | INSTRUMENT FOR TESTING SOLID-STATE IMAGING DEVICE |
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