CMP APPARATUS WITH COMPRESSED COIL SPRING FOR CONTROLLING GAP BETWEEN RETAINER RING AND CARRIER
PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus is provided to control the gap between a retainer ring and a carrier by using a compressed coil spring. CONSTITUTION: A CMP apparatus includes a pneumatic membrane(132) for loading and unloading a wafer, a flexure(133), a retainer ring(135) for...
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creator | JUNG, MYEONG JIN |
description | PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus is provided to control the gap between a retainer ring and a carrier by using a compressed coil spring. CONSTITUTION: A CMP apparatus includes a pneumatic membrane(132) for loading and unloading a wafer, a flexure(133), a retainer ring(135) for guiding the wafer and pressing a polishing pad(134), and a fixing screw(138) for fixing the retainer ring to a carrier(137). A compressed coil spring(136) is installed between the retainer ring and the carrier to control the gap between the retainer ring and the carrier. |
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CONSTITUTION: A CMP apparatus includes a pneumatic membrane(132) for loading and unloading a wafer, a flexure(133), a retainer ring(135) for guiding the wafer and pressing a polishing pad(134), and a fixing screw(138) for fixing the retainer ring to a carrier(137). A compressed coil spring(136) is installed between the retainer ring and the carrier to control the gap between the retainer ring and the carrier.</description><edition>7</edition><language>eng ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; DRESSING OR CONDITIONING OF ABRADING SURFACES ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; PERFORMING OPERATIONS ; POLISHING ; SEMICONDUCTOR DEVICES ; TRANSPORTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041208&DB=EPODOC&CC=KR&NR=20040102398A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041208&DB=EPODOC&CC=KR&NR=20040102398A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JUNG, MYEONG JIN</creatorcontrib><title>CMP APPARATUS WITH COMPRESSED COIL SPRING FOR CONTROLLING GAP BETWEEN RETAINER RING AND CARRIER</title><description>PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus is provided to control the gap between a retainer ring and a carrier by using a compressed coil spring. CONSTITUTION: A CMP apparatus includes a pneumatic membrane(132) for loading and unloading a wafer, a flexure(133), a retainer ring(135) for guiding the wafer and pressing a polishing pad(134), and a fixing screw(138) for fixing the retainer ring to a carrier(137). A compressed coil spring(136) is installed between the retainer ring and the carrier to control the gap between the retainer ring and the carrier.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>PERFORMING OPERATIONS</subject><subject>POLISHING</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi7EKwjAURbM4iPoPD5yF2Dro-KyvbTBNwkukYygSJ9FC_X-M4gc43XPg3LmIVecAnUPGcPHQq9BCZTvH5D2dMioN3rEyDdSWs5vAVuuPN-jgSKEnMsAUUBli-JZo8hOZFfFSzG7DfUqr3y7EuqZQtZs0PmOaxuGaHukVz1xIuZNbWZSHPZb_VW8ajDPx</recordid><startdate>20041208</startdate><enddate>20041208</enddate><creator>JUNG, MYEONG JIN</creator><scope>EVB</scope></search><sort><creationdate>20041208</creationdate><title>CMP APPARATUS WITH COMPRESSED COIL SPRING FOR CONTROLLING GAP BETWEEN RETAINER RING AND CARRIER</title><author>JUNG, MYEONG JIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20040102398A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2004</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>PERFORMING OPERATIONS</topic><topic>POLISHING</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JUNG, MYEONG JIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JUNG, MYEONG JIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CMP APPARATUS WITH COMPRESSED COIL SPRING FOR CONTROLLING GAP BETWEEN RETAINER RING AND CARRIER</title><date>2004-12-08</date><risdate>2004</risdate><abstract>PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus is provided to control the gap between a retainer ring and a carrier by using a compressed coil spring. CONSTITUTION: A CMP apparatus includes a pneumatic membrane(132) for loading and unloading a wafer, a flexure(133), a retainer ring(135) for guiding the wafer and pressing a polishing pad(134), and a fixing screw(138) for fixing the retainer ring to a carrier(137). A compressed coil spring(136) is installed between the retainer ring and the carrier to control the gap between the retainer ring and the carrier.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS DRESSING OR CONDITIONING OF ABRADING SURFACES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS GRINDING MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING PERFORMING OPERATIONS POLISHING SEMICONDUCTOR DEVICES TRANSPORTING |
title | CMP APPARATUS WITH COMPRESSED COIL SPRING FOR CONTROLLING GAP BETWEEN RETAINER RING AND CARRIER |
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