Method for Removing Impurity On Chloride Ion Analysis in Scrubbing Wastewater By Silver Nitrate Titration
PURPOSE: A method for removing impurity on chloride ion analysis in scrubbing wastewater by silver nitrate titration is provided, thereby accurately, continuously and automatically analyzing pH and Cl concentration in scrubbing wastewater, inhibiting corrosion of an apparatus for scrubbing, and impr...
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| Format: | Patent |
| Sprache: | eng ; kor |
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| Zusammenfassung: | PURPOSE: A method for removing impurity on chloride ion analysis in scrubbing wastewater by silver nitrate titration is provided, thereby accurately, continuously and automatically analyzing pH and Cl concentration in scrubbing wastewater, inhibiting corrosion of an apparatus for scrubbing, and improving scrubbing efficiency. CONSTITUTION: The method for removing impurity such as silver chloride formed in chlorine ion titration on chloride ion analysis in scrubbing wastewater comprises the steps of: cleaning the apparatus for analysis of Cl concentration with 0.75 to 1.5N of ammonia water; inserting the scrubbing wastewater into the apparatus and analyzing the content of chlorine ion in scrubbing wastewater; discharging the scrubbing wastewater from the apparatus; and cleaning the apparatus with 0.75 to 1.5N of ammonia water.
질산은 적정법으로 고로 집진수중의 염소이온 적정시 형성되는 염화은을 제거하는 방법에 관한 것이다. 질산은 적정법으로 고로집진수중의 염소이온의 함량을 자동분석함에 있어서, 0.75-1.5N의 암모니아수를 주입하는 염화은 제거방법이 제공된다. 암모니아수를 자동분석 장치에 주입하여 전극 및 반응용기에 침전되어 있는 염화은 코팅물질을 제거함으로써, 고로 B/S 집진수 중의 pH 및 Cl농도를 효과적으로 정밀하게 연속적으로 자동 분석할 수 있으며, 나아가, 고로 B/S설비 부식 및 스케일 방지와 집진효율 향상이 기대된다. |
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