Method for prevention of frost in semiconductor test handler

PURPOSE: A method for preventing frost of a semiconductor device test handler is provided to minimize the generation of the frost by using the contact between the cooling fluid and the external air. CONSTITUTION: A test site of a handler includes a preheating portion, a test socket(3), and an index...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HWANG, HYEON JU, RYU, GEUN HO
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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