Spectral reflectance measuring apparatus and spectral reflectance measuring method

PURPOSE: To provide a spectral reflectance measuring apparatus and method capable of measuring the reflectance of light with a specific wavelength, over a wide wavelength range including the ultraviolet range, and easily obtaining a reference value. CONSTITUTION: The spectral reflectance measuring a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SHINBORI MASASHI, KAMEDA HIROYUKI, MOROISHI KOUTAROU
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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