NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME
PURPOSE: A novel group IV metal precursor is provided which displays superior volatility and thermal characteristics, has excellent chemical stability for hydrolysis, and is particularly suitable for the formation of a multi-component metal oxide thin film comprising a group IV metal such as titaniu...
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creator | CHOI, BO HYEON LIM, SEON GWON LEE, IK MO CHO, YEONG JIN KIM, DAE SIK LEE, WAN IN MIN, YO SEP |
description | PURPOSE: A novel group IV metal precursor is provided which displays superior volatility and thermal characteristics, has excellent chemical stability for hydrolysis, and is particularly suitable for the formation of a multi-component metal oxide thin film comprising a group IV metal such as titanium, and a chemical vapor deposition method using the same is provided. CONSTITUTION: The metal organic precursor for manufacturing a metal oxide thin film consists of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 and a quadrivalent group IV metal(M), and represented as M(L)2:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein the quadrivalent group IV metal(M) is Ti. The chemical vapor deposition method is characterized in that a metal oxide thin film is formed by using a complex of a quadrivalent IV group metal(M) and a chemical formula M(L)2 consisting of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 as a quadrivalent IV group metal precursor:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein a complex of formula Ti(L)2 in which the quadrivalent IV group metal(M) is Ti is used as a titanium precursor. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20020016748A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20020016748A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20020016748A3</originalsourceid><addsrcrecordid>eNqNiksKwjAUALNxIeodHrgW6gd1G5JnE2zyQn7bUiSuRAv1_hjBAwgDA8PMmbeUsYPWU3KgMxiMvAPnUSQfyAO3EoRCo0XNmbuaJDoKOmqy31uRhBS0bSEqhMANLtnsPjymsvp5wdYXjEJtyvjqyzQOt_Is7_7qd01T2R5PhzPf_3d9AIR7MFY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME</title><source>esp@cenet</source><creator>CHOI, BO HYEON ; LIM, SEON GWON ; LEE, IK MO ; CHO, YEONG JIN ; KIM, DAE SIK ; LEE, WAN IN ; MIN, YO SEP</creator><creatorcontrib>CHOI, BO HYEON ; LIM, SEON GWON ; LEE, IK MO ; CHO, YEONG JIN ; KIM, DAE SIK ; LEE, WAN IN ; MIN, YO SEP</creatorcontrib><description>PURPOSE: A novel group IV metal precursor is provided which displays superior volatility and thermal characteristics, has excellent chemical stability for hydrolysis, and is particularly suitable for the formation of a multi-component metal oxide thin film comprising a group IV metal such as titanium, and a chemical vapor deposition method using the same is provided. CONSTITUTION: The metal organic precursor for manufacturing a metal oxide thin film consists of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 and a quadrivalent group IV metal(M), and represented as M(L)2:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein the quadrivalent group IV metal(M) is Ti. The chemical vapor deposition method is characterized in that a metal oxide thin film is formed by using a complex of a quadrivalent IV group metal(M) and a chemical formula M(L)2 consisting of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 as a quadrivalent IV group metal precursor:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein a complex of formula Ti(L)2 in which the quadrivalent IV group metal(M) is Ti is used as a titanium precursor.</description><edition>7</edition><language>eng ; kor</language><subject>CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020306&DB=EPODOC&CC=KR&NR=20020016748A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020306&DB=EPODOC&CC=KR&NR=20020016748A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHOI, BO HYEON</creatorcontrib><creatorcontrib>LIM, SEON GWON</creatorcontrib><creatorcontrib>LEE, IK MO</creatorcontrib><creatorcontrib>CHO, YEONG JIN</creatorcontrib><creatorcontrib>KIM, DAE SIK</creatorcontrib><creatorcontrib>LEE, WAN IN</creatorcontrib><creatorcontrib>MIN, YO SEP</creatorcontrib><title>NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME</title><description>PURPOSE: A novel group IV metal precursor is provided which displays superior volatility and thermal characteristics, has excellent chemical stability for hydrolysis, and is particularly suitable for the formation of a multi-component metal oxide thin film comprising a group IV metal such as titanium, and a chemical vapor deposition method using the same is provided. CONSTITUTION: The metal organic precursor for manufacturing a metal oxide thin film consists of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 and a quadrivalent group IV metal(M), and represented as M(L)2:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein the quadrivalent group IV metal(M) is Ti. The chemical vapor deposition method is characterized in that a metal oxide thin film is formed by using a complex of a quadrivalent IV group metal(M) and a chemical formula M(L)2 consisting of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 as a quadrivalent IV group metal precursor:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein a complex of formula Ti(L)2 in which the quadrivalent IV group metal(M) is Ti is used as a titanium precursor.</description><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNiksKwjAUALNxIeodHrgW6gd1G5JnE2zyQn7bUiSuRAv1_hjBAwgDA8PMmbeUsYPWU3KgMxiMvAPnUSQfyAO3EoRCo0XNmbuaJDoKOmqy31uRhBS0bSEqhMANLtnsPjymsvp5wdYXjEJtyvjqyzQOt_Is7_7qd01T2R5PhzPf_3d9AIR7MFY</recordid><startdate>20020306</startdate><enddate>20020306</enddate><creator>CHOI, BO HYEON</creator><creator>LIM, SEON GWON</creator><creator>LEE, IK MO</creator><creator>CHO, YEONG JIN</creator><creator>KIM, DAE SIK</creator><creator>LEE, WAN IN</creator><creator>MIN, YO SEP</creator><scope>EVB</scope></search><sort><creationdate>20020306</creationdate><title>NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME</title><author>CHOI, BO HYEON ; LIM, SEON GWON ; LEE, IK MO ; CHO, YEONG JIN ; KIM, DAE SIK ; LEE, WAN IN ; MIN, YO SEP</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20020016748A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2002</creationdate><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>CHOI, BO HYEON</creatorcontrib><creatorcontrib>LIM, SEON GWON</creatorcontrib><creatorcontrib>LEE, IK MO</creatorcontrib><creatorcontrib>CHO, YEONG JIN</creatorcontrib><creatorcontrib>KIM, DAE SIK</creatorcontrib><creatorcontrib>LEE, WAN IN</creatorcontrib><creatorcontrib>MIN, YO SEP</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHOI, BO HYEON</au><au>LIM, SEON GWON</au><au>LEE, IK MO</au><au>CHO, YEONG JIN</au><au>KIM, DAE SIK</au><au>LEE, WAN IN</au><au>MIN, YO SEP</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME</title><date>2002-03-06</date><risdate>2002</risdate><abstract>PURPOSE: A novel group IV metal precursor is provided which displays superior volatility and thermal characteristics, has excellent chemical stability for hydrolysis, and is particularly suitable for the formation of a multi-component metal oxide thin film comprising a group IV metal such as titanium, and a chemical vapor deposition method using the same is provided. CONSTITUTION: The metal organic precursor for manufacturing a metal oxide thin film consists of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 and a quadrivalent group IV metal(M), and represented as M(L)2:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein the quadrivalent group IV metal(M) is Ti. The chemical vapor deposition method is characterized in that a metal oxide thin film is formed by using a complex of a quadrivalent IV group metal(M) and a chemical formula M(L)2 consisting of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 as a quadrivalent IV group metal precursor:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein a complex of formula Ti(L)2 in which the quadrivalent IV group metal(M) is Ti is used as a titanium precursor.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL METALLURGY SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION |
title | NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME |
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