NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME

PURPOSE: A novel group IV metal precursor is provided which displays superior volatility and thermal characteristics, has excellent chemical stability for hydrolysis, and is particularly suitable for the formation of a multi-component metal oxide thin film comprising a group IV metal such as titaniu...

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Hauptverfasser: CHOI, BO HYEON, LIM, SEON GWON, LEE, IK MO, CHO, YEONG JIN, KIM, DAE SIK, LEE, WAN IN, MIN, YO SEP
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LIM, SEON GWON
LEE, IK MO
CHO, YEONG JIN
KIM, DAE SIK
LEE, WAN IN
MIN, YO SEP
description PURPOSE: A novel group IV metal precursor is provided which displays superior volatility and thermal characteristics, has excellent chemical stability for hydrolysis, and is particularly suitable for the formation of a multi-component metal oxide thin film comprising a group IV metal such as titanium, and a chemical vapor deposition method using the same is provided. CONSTITUTION: The metal organic precursor for manufacturing a metal oxide thin film consists of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 and a quadrivalent group IV metal(M), and represented as M(L)2:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein the quadrivalent group IV metal(M) is Ti. The chemical vapor deposition method is characterized in that a metal oxide thin film is formed by using a complex of a quadrivalent IV group metal(M) and a chemical formula M(L)2 consisting of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 as a quadrivalent IV group metal precursor:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein a complex of formula Ti(L)2 in which the quadrivalent IV group metal(M) is Ti is used as a titanium precursor.
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CONSTITUTION: The metal organic precursor for manufacturing a metal oxide thin film consists of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 and a quadrivalent group IV metal(M), and represented as M(L)2:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein the quadrivalent group IV metal(M) is Ti. The chemical vapor deposition method is characterized in that a metal oxide thin film is formed by using a complex of a quadrivalent IV group metal(M) and a chemical formula M(L)2 consisting of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 as a quadrivalent IV group metal precursor:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein a complex of formula Ti(L)2 in which the quadrivalent IV group metal(M) is Ti is used as a titanium precursor.</description><edition>7</edition><language>eng ; kor</language><subject>CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20020306&amp;DB=EPODOC&amp;CC=KR&amp;NR=20020016748A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20020306&amp;DB=EPODOC&amp;CC=KR&amp;NR=20020016748A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHOI, BO HYEON</creatorcontrib><creatorcontrib>LIM, SEON GWON</creatorcontrib><creatorcontrib>LEE, IK MO</creatorcontrib><creatorcontrib>CHO, YEONG JIN</creatorcontrib><creatorcontrib>KIM, DAE SIK</creatorcontrib><creatorcontrib>LEE, WAN IN</creatorcontrib><creatorcontrib>MIN, YO SEP</creatorcontrib><title>NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME</title><description>PURPOSE: A novel group IV metal precursor is provided which displays superior volatility and thermal characteristics, has excellent chemical stability for hydrolysis, and is particularly suitable for the formation of a multi-component metal oxide thin film comprising a group IV metal such as titanium, and a chemical vapor deposition method using the same is provided. 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CONSTITUTION: The metal organic precursor for manufacturing a metal oxide thin film consists of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 and a quadrivalent group IV metal(M), and represented as M(L)2:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein the quadrivalent group IV metal(M) is Ti. The chemical vapor deposition method is characterized in that a metal oxide thin film is formed by using a complex of a quadrivalent IV group metal(M) and a chemical formula M(L)2 consisting of a negative bivalent tridentate ligand(L) represented as in the following Formula 1 as a quadrivalent IV group metal precursor:£Formula 1|where each of R1 and R2 are linear or branched alkyl groups having carbon numbers of 1 to 8, and R3 is a linear or branched alkylene group having carbon numbers of 1 to 8, wherein a complex of formula Ti(L)2 in which the quadrivalent IV group metal(M) is Ti is used as a titanium precursor.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title NOVEL GROUP IV METAL PRECURSOR AND CHEMICAL VAPOR DEPOSITION METHOD USING THE SAME
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