APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR PRODUCTS

PURPOSE: An apparatus and a method for testing semiconductor products are provided to continuously test the semiconductor products by forming at least one test region on a test stage where the test is performed. CONSTITUTION: In an apparatus for testing semiconductor products, a test unit is set at...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PARK, YOUNG JUN, SUNG, NAK YOUNG, HWANG, MAN IL
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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