APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR PRODUCTS

PURPOSE: An apparatus and a method for testing semiconductor products are provided to continuously test the semiconductor products by forming at least one test region on a test stage where the test is performed. CONSTITUTION: In an apparatus for testing semiconductor products, a test unit is set at...

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Hauptverfasser:	PARK, YOUNG JUN, SUNG, NAK YOUNG, HWANG, MAN IL
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PURPOSE: An apparatus and a method for testing semiconductor products are provided to continuously test the semiconductor products by forming at least one test region on a test stage where the test is performed. CONSTITUTION: In an apparatus for testing semiconductor products, a test unit is set at a predetermined region of the body of the testing apparatus. The test unit includes at least one test pad(231,232) on which the semiconductor products(202,203) are mounted to be tested, a probe pin(234) protruded from the test pad, and a semiconductor product fixing device(233) for fixing the body of the semiconductor product to the test pad. A semiconductor product providing means supplies the semiconductor products to the test unit. A semiconductor product storing means stores semiconductor products which have been tested by the test unit. The testing apparatus also has a transferring means for receiving the semiconductor products from the semiconductor product providing means and transferring the products to the test unit and the semiconductor product storing means.