SUBSTRATE HAVING THIN FILM AND ENERGY-SENSITIVE ELECTRONIC COMPONENT HAVING THE SAME

According to one aspect of the present invention, a substrate having a thin film, which can improve the reliability of a function thin film, comprises: an AI_2O_3 single crystal base substrate; and a VO_2 function thin film which is disposed on the AI_2O_3 single crystal base substrate, and on which...

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1. Verfasser: HAN SOODEOK
Format: Patent
Sprache:eng ; kor
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Zusammenfassung:According to one aspect of the present invention, a substrate having a thin film, which can improve the reliability of a function thin film, comprises: an AI_2O_3 single crystal base substrate; and a VO_2 function thin film which is disposed on the AI_2O_3 single crystal base substrate, and on which Ti is dopped. For the function thin film, when setting resistance at 25℃ as R1, and resistance 80℃ as R2, R1/R2 may be 10^4 or more. For the function thin film, when setting a heating process from 25℃ to 80℃ and a cooling process from 80℃ to 25℃ as one cycle, a change (V_△T) in a hysteresis temperature difference (△T) for ten cycles may be 1℃ or lower, a change (V_TMI) in a phase transition temperature (T_MI) for ten cycles may be 1.5℃ or lower, or a change (V_R1/R2) in R1/R2 for ten cycles may be 5% or lower. 본 발명의 일 측면에 따른 박막 기판은, Al2O3 단결정 베이스 기판; 및 상기 베이스 기판에 배치되고, Ti가 도핑되어 있는 VO2 기능 박막 을 포함하고, 상기 기능 박막은, 25℃에서의 저항을 R1, 80℃에서의 저항을 R2라고 할 때, R1/R2 가 104 이상이고, 상기 기능 박막은, 25℃로부터 80℃까지의 승온 과정과 80℃부터 25℃까지의 냉각 과정을 1 싸이클이라고 할 때, 10 싸이클 동안 히스테리시스 온도 차(△T)의 변화(V△T)가 1℃ 이하이거나, 10 싸이클 동안 상전이 온도(TMI)의 변화(VTMI)가 1.5℃ 이하이거나, 10 싸이클 동안 R1/R2의 변화율(VR1/R2)이 5% 이하일 수 있다.