APPARATUS AND METHOD FOR AUTOMATED TRAINING LEARNING MODEL FOR FAULT DETECTION BASED ON ARTIFICIAL INTELLIGENCE
The present disclosure relates to an artificial intelligence-based automated defect detection learning model training device and a method. The device generates, as training data, a defective image labeled as defective, and a good image labeled as good product among images grouped into the same group...
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| creator | BANG SEONGDEOK |
| description | The present disclosure relates to an artificial intelligence-based automated defect detection learning model training device and a method. The device generates, as training data, a defective image labeled as defective, and a good image labeled as good product among images grouped into the same group as the defective image to perform supervised learning of the learning model based on the generated learning data.
본 개시는 인공지능 기반의 자동화된 불량 검출 학습 모델 훈련 장치 및 방법에 관한 것으로, 상기 장치는, 불량으로 라벨링된 불량 이미지 및 상기 불량 이미지와 동일한 그룹으로 그룹핑된 이미지들 중 상기 양품으로 라벨링된 양품 이미지를 학습 데이터로 생성하고, 상기 생성된 학습 데이터를 기반으로 상기 학습 모델의 지도학습을 수행하는 것이다. |
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본 개시는 인공지능 기반의 자동화된 불량 검출 학습 모델 훈련 장치 및 방법에 관한 것으로, 상기 장치는, 불량으로 라벨링된 불량 이미지 및 상기 불량 이미지와 동일한 그룹으로 그룹핑된 이미지들 중 상기 양품으로 라벨링된 양품 이미지를 학습 데이터로 생성하고, 상기 생성된 학습 데이터를 기반으로 상기 학습 모델의 지도학습을 수행하는 것이다.</description><language>eng ; kor</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221006&DB=EPODOC&CC=KR&NR=102450965B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221006&DB=EPODOC&CC=KR&NR=102450965B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BANG SEONGDEOK</creatorcontrib><title>APPARATUS AND METHOD FOR AUTOMATED TRAINING LEARNING MODEL FOR FAULT DETECTION BASED ON ARTIFICIAL INTELLIGENCE</title><description>The present disclosure relates to an artificial intelligence-based automated defect detection learning model training device and a method. The device generates, as training data, a defective image labeled as defective, and a good image labeled as good product among images grouped into the same group as the defective image to perform supervised learning of the learning model based on the generated learning data.
본 개시는 인공지능 기반의 자동화된 불량 검출 학습 모델 훈련 장치 및 방법에 관한 것으로, 상기 장치는, 불량으로 라벨링된 불량 이미지 및 상기 불량 이미지와 동일한 그룹으로 그룹핑된 이미지들 중 상기 양품으로 라벨링된 양품 이미지를 학습 데이터로 생성하고, 상기 생성된 학습 데이터를 기반으로 상기 학습 모델의 지도학습을 수행하는 것이다.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi00LgkAQQL10iOo_DHQOtC_oOO7O6tC6K-t4FontFCnY_yeRfkCn9w7vrZMB6xoDStsAOg0VSek1GB8AW_EVCmmQgOzYFWAJwyKV12SXymBrBTQJKWHvIMdmPmbBIGxYMVpgJ2QtF-QUbZPVs39NcffjJtkbElUe4jh0cRr7R3zHT3cPWXo8X9Lb9ZLn2em_6gtexzhQ</recordid><startdate>20221006</startdate><enddate>20221006</enddate><creator>BANG SEONGDEOK</creator><scope>EVB</scope></search><sort><creationdate>20221006</creationdate><title>APPARATUS AND METHOD FOR AUTOMATED TRAINING LEARNING MODEL FOR FAULT DETECTION BASED ON ARTIFICIAL INTELLIGENCE</title><author>BANG SEONGDEOK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR102450965BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>BANG SEONGDEOK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BANG SEONGDEOK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS AND METHOD FOR AUTOMATED TRAINING LEARNING MODEL FOR FAULT DETECTION BASED ON ARTIFICIAL INTELLIGENCE</title><date>2022-10-06</date><risdate>2022</risdate><abstract>The present disclosure relates to an artificial intelligence-based automated defect detection learning model training device and a method. The device generates, as training data, a defective image labeled as defective, and a good image labeled as good product among images grouped into the same group as the defective image to perform supervised learning of the learning model based on the generated learning data.
본 개시는 인공지능 기반의 자동화된 불량 검출 학습 모델 훈련 장치 및 방법에 관한 것으로, 상기 장치는, 불량으로 라벨링된 불량 이미지 및 상기 불량 이미지와 동일한 그룹으로 그룹핑된 이미지들 중 상기 양품으로 라벨링된 양품 이미지를 학습 데이터로 생성하고, 상기 생성된 학습 데이터를 기반으로 상기 학습 모델의 지도학습을 수행하는 것이다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | APPARATUS AND METHOD FOR AUTOMATED TRAINING LEARNING MODEL FOR FAULT DETECTION BASED ON ARTIFICIAL INTELLIGENCE |
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