A/B Testing Platform with Anomaly Detection
The present invention relates to a method for providing an A/B testing platform, which includes the steps of: receiving input data including a testing unique number through software development kit interworking, by a processor; managing, by the processor, A/B testing matching the unique number; and...
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creator | CHANGHAK SUNWOO YONGWOO KIM JONGMIN KIM OHBIN KWON |
description | The present invention relates to a method for providing an A/B testing platform, which includes the steps of: receiving input data including a testing unique number through software development kit interworking, by a processor; managing, by the processor, A/B testing matching the unique number; and providing, by the processor, an A/B testing result value derived based on the input data. In the method for providing an A/B testing platform, a step of managing an anomaly based on a preset threshold, by the processor, is further included.
본 발명은 프로세서가, SDK(Software development kit) 연동을 통해, 테스팅 고유 번호가 포함된 인풋 데이터를 수신하는 단계; 프로세서가, 상기 고유 번호와 매칭되는 에이비 테스팅을 관리하는 단계; 및 프로세서가, 상기 인풋 데이터에 기초하여 도출된 에이비 테스팅 결과값을 제공하는 단계;를 포함하는 에이비 테스팅 플랫폼 제공 방법에 관한 것이다. 상기 에이비 테스팅 플랫폼 제공 방법은, 프로세서가, 기 설정된 임계치에 기초하여, 이상징후를 관리하는 단계;를 더 포함한다. |
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본 발명은 프로세서가, SDK(Software development kit) 연동을 통해, 테스팅 고유 번호가 포함된 인풋 데이터를 수신하는 단계; 프로세서가, 상기 고유 번호와 매칭되는 에이비 테스팅을 관리하는 단계; 및 프로세서가, 상기 인풋 데이터에 기초하여 도출된 에이비 테스팅 결과값을 제공하는 단계;를 포함하는 에이비 테스팅 플랫폼 제공 방법에 관한 것이다. 상기 에이비 테스팅 플랫폼 제공 방법은, 프로세서가, 기 설정된 임계치에 기초하여, 이상징후를 관리하는 단계;를 더 포함한다.</description><language>eng ; kor</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211007&DB=EPODOC&CC=KR&NR=102309715B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211007&DB=EPODOC&CC=KR&NR=102309715B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHANGHAK SUNWOO</creatorcontrib><creatorcontrib>YONGWOO KIM</creatorcontrib><creatorcontrib>JONGMIN KIM</creatorcontrib><creatorcontrib>OHBIN KWON</creatorcontrib><title>A/B Testing Platform with Anomaly Detection</title><description>The present invention relates to a method for providing an A/B testing platform, which includes the steps of: receiving input data including a testing unique number through software development kit interworking, by a processor; managing, by the processor, A/B testing matching the unique number; and providing, by the processor, an A/B testing result value derived based on the input data. In the method for providing an A/B testing platform, a step of managing an anomaly based on a preset threshold, by the processor, is further included.
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본 발명은 프로세서가, SDK(Software development kit) 연동을 통해, 테스팅 고유 번호가 포함된 인풋 데이터를 수신하는 단계; 프로세서가, 상기 고유 번호와 매칭되는 에이비 테스팅을 관리하는 단계; 및 프로세서가, 상기 인풋 데이터에 기초하여 도출된 에이비 테스팅 결과값을 제공하는 단계;를 포함하는 에이비 테스팅 플랫폼 제공 방법에 관한 것이다. 상기 에이비 테스팅 플랫폼 제공 방법은, 프로세서가, 기 설정된 임계치에 기초하여, 이상징후를 관리하는 단계;를 더 포함한다.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
title | A/B Testing Platform with Anomaly Detection |
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