A/B Testing Platform with Anomaly Detection

The present invention relates to a method for providing an A/B testing platform, which includes the steps of: receiving input data including a testing unique number through software development kit interworking, by a processor; managing, by the processor, A/B testing matching the unique number; and...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHANGHAK SUNWOO, YONGWOO KIM, JONGMIN KIM, OHBIN KWON
Format: Patent
Sprache:eng ; kor
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Beschreibung
Zusammenfassung:The present invention relates to a method for providing an A/B testing platform, which includes the steps of: receiving input data including a testing unique number through software development kit interworking, by a processor; managing, by the processor, A/B testing matching the unique number; and providing, by the processor, an A/B testing result value derived based on the input data. In the method for providing an A/B testing platform, a step of managing an anomaly based on a preset threshold, by the processor, is further included. 본 발명은 프로세서가, SDK(Software development kit) 연동을 통해, 테스팅 고유 번호가 포함된 인풋 데이터를 수신하는 단계; 프로세서가, 상기 고유 번호와 매칭되는 에이비 테스팅을 관리하는 단계; 및 프로세서가, 상기 인풋 데이터에 기초하여 도출된 에이비 테스팅 결과값을 제공하는 단계;를 포함하는 에이비 테스팅 플랫폼 제공 방법에 관한 것이다. 상기 에이비 테스팅 플랫폼 제공 방법은, 프로세서가, 기 설정된 임계치에 기초하여, 이상징후를 관리하는 단계;를 더 포함한다.