APPARATUS FOR TESTING ELECTROSTATIC CHUCKS

Disclosed is a device for testing whether the temperature of an adsorbed substrate is uniformly controlled during substrate processing. The device includes a stage which has an electrostatic chuck placed on a top plate thereof and a chamber housing that can be lifted along first and second guides in...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KIM SUNG MAN, LEE JUN HO, LEE KYU YOUNG, KANG CHANG SEONG
Format: Patent
Sprache:eng ; kor
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Disclosed is a device for testing whether the temperature of an adsorbed substrate is uniformly controlled during substrate processing. The device includes a stage which has an electrostatic chuck placed on a top plate thereof and a chamber housing that can be lifted along first and second guides installed on the top plate. A chamber is defined by the stage and the chamber housing. A heater is prepared in the chamber housing to be lifted. A substrate is adsorbed by the electrostatic chuck, and temperature sensors are disposed at a plurality of positions on the substrate. Temperature values measured by the temperature sensors are sent to a control unit, and the temperature distribution of the substrate heated by the heater is analyzed. 기판 처리 중 흡착된 기판의 온도가 균일 제어되는지 여부를 테스트하기 위한 장치가 소개된다. 장치는 탑플레이트 상에 정전척이 놓이는 스테이지 및 탑플레이트 상에 설치된 제1 및 제2 가이드를 따라 승강 가능한 챔버 하우징을 구비한다. 스테이지와 챔버 하우징에 의해 챔버가 규정된다. 챔버 하우징 내에는 승강 가능하게 히터가 마련된다. 정전척에 의해 기판이 흡착되며, 기판 상의 복수 위치에 온도센서가 배치된다. 이 온도센서에 의해 측정된 온도값은 제어부로 송출되어, 히터에 의해 가열된 기판의 온도 분포가 분석된다.