INSPECTION CONDITION OPTIMIZATION SYSTEM

The present invention relates to an inspection condition optimization system for forming a preset quality and standard inspection optimization condition. According to an embodiment of the present invention, a photographing unit and a light output unit are automatically controlled to form a preset qu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PRIMOV ELDOR, KIM. TAE WOON, KIM YOUNG JOON, KONG SUNG EON
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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