INSPECTION CONDITION OPTIMIZATION SYSTEM
The present invention relates to an inspection condition optimization system for forming a preset quality and standard inspection optimization condition. According to an embodiment of the present invention, a photographing unit and a light output unit are automatically controlled to form a preset qu...
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| Format: | Patent |
| Sprache: | eng ; kor |
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| Zusammenfassung: | The present invention relates to an inspection condition optimization system for forming a preset quality and standard inspection optimization condition. According to an embodiment of the present invention, a photographing unit and a light output unit are automatically controlled to form a preset quality and standard inspection condition in accordance with optical conditions of a measurement space and characteristics of a target product, which is an inspection object. Accordingly, inconvenience in which an operator has to set the preset quality and standard inspection condition can be reduced, and the quality and standard inspection condition of the predetermined target product can be constantly maintained.
본 발명은 기설정된 품질 및 규격검사 최적화 조건을 형성하기 위한 검사조건 최적화 시스템에 관한 것이다. 본 발명의 실시예에 의하면, 측정공간의 광학조건과 검사 대상물인 타겟제품의 특성에 따라 기설정된 품질 및 규격검사 조건이 형성되도록 촬영부와 조명출력부를 자동 제어함에 따라, 오퍼레이터가 기설정된 품질 및 규격검사 조건을 셋팅해야 하는 번거로움을 줄일 수 있으며, 기설정된 타겟제품의 품질 및 규격검사 조건을 일정하게 유지할 수 있는 효과가 있다. |
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