AVO Pseudo amplitude versus offset analysis using partial-stack data

The present invention relates to an amplitude versus offset (AVO) analysis technique. More specifically, as an existing AVO analysis technique requiring mass-data processing is improved, a pseudo AVO analysis method is provided to more conveniently confirm whether or not gas exists based on a phenom...

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Bibliographische Detailangaben
Hauptverfasser: LEE YONG HO, PARK KYUNG SICK, OH KWON TAEK, KIM JUNG KYU, LIM HEON HAK
Format: Patent
Sprache:eng ; kor
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Zusammenfassung:The present invention relates to an amplitude versus offset (AVO) analysis technique. More specifically, as an existing AVO analysis technique requiring mass-data processing is improved, a pseudo AVO analysis method is provided to more conveniently confirm whether or not gas exists based on a phenomenon, in which variation aspects of a reflection coefficient in accordance with a change in an offset or incidence angle vary on a gas existence layer, even with a small volume of data. 본 발명은 AVO(Amplitude versus offset) 분석법에 관한 것으로서, 보다 구체적으로는 대용량의 데이터 처리를 필요로 하는 종래의 AVO 분석법을 개선하여 보다 간편한 방법으로 적은 양의 데이터로도 가스 부존층에서의 입사각 또는 벌림거리(offset)의 변화에 따른 반사계수(Reflection Coefficient)의 변화 양상이 다르다는 것을 이용하여 가스 부존 여부를 확인할 수 있도록 한 유사 AVO 분석법을 제공한다.