APPARATUS AND METHOD FOR SUPPORTING DESIGN OF ELECTROMAGNETIC WAVE ABSORBER

Disclosed is an auxiliary device for designing an electromagnetic wave absorbing body which comprises: a scanning free space measurer measuring electromagnetic performance for each of a plurality of scanning regions configuring the entire region of a specimen with respect to a specimen produced by r...

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Bibliographische Detailangaben
Hauptverfasser:	KIM SANG YONG, KWON O BUM, LEE WON JUN, KIM YOON JAE, BAEK SANG MIN, GO JUNG IN, SON DAE SUNG, LEE JUGN RYUL
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	ANTENNAS, i.e. RADIO AERIALS BASIC ELECTRIC ELEMENTS CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TESTING
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Beschreibung
Zusammenfassung:	Disclosed is an auxiliary device for designing an electromagnetic wave absorbing body which comprises: a scanning free space measurer measuring electromagnetic performance for each of a plurality of scanning regions configuring the entire region of a specimen with respect to a specimen produced by reflecting design variables and manufacturing variables defined in accordance with the electromagnetic performance required for an electromagnetic absorbing body; and a controller controlling the measurement of the electromagnetic performance by the scanning free space measurer, analyzing the electromagnetic performance measured by the electromagnetic performance of the specimen measured by the scanning free space measurer to check a defective position of the specimen, and redefining the design variables and the manufacturing variables based on the checked defective position. 개시된 전자기파 흡수체 설계 보조 장치는 전자기파 흡수체에 대해 요구되는 전자기 성능에 따라 정의된 설계 변수 및 제조 변수를 반영하여 제작된 시편에 대해, 시편의 전영역을 구성하는 복수의 스캐닝 영역별로 전자기 성능을 측정하는 스캐닝 자유공간 측정기와, 스캐닝 자유공간 측정기에 의한 전자기 성능의 측정을 제어하고, 스캐닝 자유공간 측정기에 의해 측정된 시편의 전자기 성능을 분석하여 시편의 결함 위치를 확인하며, 확인된 결함 위치에 기초하여 설계 변수 및 제조 변수를 재정의하는 제어기를 포함한다.