System and Method for Testing of Probe Card

According to an embodiment of the present invention, a probe card test system includes a probe card with a plurality of needles, a contactor including a pad in contact with the plurality of needles one-to-one, and a test body which provides a test signal to the probe card, receives a measurement sig...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PARK, JONG TAE, JEONG, KI SEONG, CHANG, KYUNG HUN, SEO, HOE CHEOL, SONG, JUNG SEUNG, OH, KYOUNG SEUNG, CHO, KYU DAE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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