APPARATUS FOR MONITORING TEMPERATURE OF TUNDISH

The present invention provides an apparatus for measuring the temperature of a tundish, which comprises: a probe; a lifting unit lifting the probe; an arm unit coupled to the lifting unit; and a support unit supporting the arm unit. The arm unit has a multistage frame, a chain unit connected to the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	WOO, JAE GWON, KIM, BOG LAE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CASTING CASTING OF METALS CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PERFORMING OPERATIONS PHYSICS POWDER METALLURGY TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR TRANSPORTING
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Beschreibung
Zusammenfassung:	The present invention provides an apparatus for measuring the temperature of a tundish, which comprises: a probe; a lifting unit lifting the probe; an arm unit coupled to the lifting unit; and a support unit supporting the arm unit. The arm unit has a multistage frame, a chain unit connected to the frame, and a drive unit winding the chain unit. 본 발명은 프로브; 상기 프로브를 승하강시키는 승강부; 상기 승강부와 결합하는 암부;및 상기 암부를 지지하는 지지부를 포함하고, 상기 암부는, 다단형 프레임과, 상기 프레임과 연결되는 체인부와, 상기 체인부를 감는 구동부를 포함하는 턴디쉬 온도 측정 장치를 제공할 수 있다.