BEAM DUMPER FOR MEASURING BEAM OUTPUT AND MONITORING OPTICAL ALIGNMENT AND STRAY LIGHT ATTENUATION OF PARTICLE COUNTER
The present invention relates to a beam dumper technique and, more specifically, to a beam dumper which is applied to a device for detecting a faint scattered light and a fluorescence signal generated by interacting single fine particles and a light emitting diode beam, and in which the stray light...
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| creator | JEONG, YOUNG SU CHOI, KI BONG CHONG, EU GENE |
| description | The present invention relates to a beam dumper technique and, more specifically, to a beam dumper which is applied to a device for detecting a faint scattered light and a fluorescence signal generated by interacting single fine particles and a light emitting diode beam, and in which the stray light does not affect performance of a particle counter by attenuating and removing a stray light generated by lens, instrument, a filter, and the like besides the scattered light and the fluorescence signal.
본 발명은 빔덤퍼 기술에 관한 것으로서, 더 상세하게는 단일 미세입자와 발광다이오드 빔이 상호작용하여 생성되는 미약한 산란광 및 형광 신호를 검출하는 장치에 적용되며 산란광 및 형광 신호 외에 렌즈, 기구, 필터 등에 의해 발생한 잡광을 감쇄하거나 제거하여 잡광이 입자계수기의 성능에 영향을 주지 않도록 하는 빔덤퍼에 대한 것이다. |
| format | Patent |
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본 발명은 빔덤퍼 기술에 관한 것으로서, 더 상세하게는 단일 미세입자와 발광다이오드 빔이 상호작용하여 생성되는 미약한 산란광 및 형광 신호를 검출하는 장치에 적용되며 산란광 및 형광 신호 외에 렌즈, 기구, 필터 등에 의해 발생한 잡광을 감쇄하거나 제거하여 잡광이 입자계수기의 성능에 영향을 주지 않도록 하는 빔덤퍼에 대한 것이다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151231&DB=EPODOC&CC=KR&NR=101580932B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151231&DB=EPODOC&CC=KR&NR=101580932B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JEONG, YOUNG SU</creatorcontrib><creatorcontrib>CHOI, KI BONG</creatorcontrib><creatorcontrib>CHONG, EU GENE</creatorcontrib><title>BEAM DUMPER FOR MEASURING BEAM OUTPUT AND MONITORING OPTICAL ALIGNMENT AND STRAY LIGHT ATTENUATION OF PARTICLE COUNTER</title><description>The present invention relates to a beam dumper technique and, more specifically, to a beam dumper which is applied to a device for detecting a faint scattered light and a fluorescence signal generated by interacting single fine particles and a light emitting diode beam, and in which the stray light does not affect performance of a particle counter by attenuating and removing a stray light generated by lens, instrument, a filter, and the like besides the scattered light and the fluorescence signal.
본 발명은 빔덤퍼 기술에 관한 것으로서, 더 상세하게는 단일 미세입자와 발광다이오드 빔이 상호작용하여 생성되는 미약한 산란광 및 형광 신호를 검출하는 장치에 적용되며 산란광 및 형광 신호 외에 렌즈, 기구, 필터 등에 의해 발생한 잡광을 감쇄하거나 제거하여 잡광이 입자계수기의 성능에 영향을 주지 않도록 하는 빔덤퍼에 대한 것이다.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi8EKgkAURd20iOofHrQONAlq-dSnDjlvhvHNopVITKsowej7E-sDWl3uPecuo3dGqKHw2pKD0jjQhK13iiuYifFivQByAdqwEjMjY0Xl2AA2qmJN_BVacXiBaaqnLkLsUZRhMCVYdNOjIciNZyG3jha3_j6GzS9X0bYkyetdGJ5dGIf-Gh7h1Z1dEieHY3xK91mWpP9ZHxJ2Oow</recordid><startdate>20151231</startdate><enddate>20151231</enddate><creator>JEONG, YOUNG SU</creator><creator>CHOI, KI BONG</creator><creator>CHONG, EU GENE</creator><scope>EVB</scope></search><sort><creationdate>20151231</creationdate><title>BEAM DUMPER FOR MEASURING BEAM OUTPUT AND MONITORING OPTICAL ALIGNMENT AND STRAY LIGHT ATTENUATION OF PARTICLE COUNTER</title><author>JEONG, YOUNG SU ; CHOI, KI BONG ; CHONG, EU GENE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR101580932BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2015</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JEONG, YOUNG SU</creatorcontrib><creatorcontrib>CHOI, KI BONG</creatorcontrib><creatorcontrib>CHONG, EU GENE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JEONG, YOUNG SU</au><au>CHOI, KI BONG</au><au>CHONG, EU GENE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>BEAM DUMPER FOR MEASURING BEAM OUTPUT AND MONITORING OPTICAL ALIGNMENT AND STRAY LIGHT ATTENUATION OF PARTICLE COUNTER</title><date>2015-12-31</date><risdate>2015</risdate><abstract>The present invention relates to a beam dumper technique and, more specifically, to a beam dumper which is applied to a device for detecting a faint scattered light and a fluorescence signal generated by interacting single fine particles and a light emitting diode beam, and in which the stray light does not affect performance of a particle counter by attenuating and removing a stray light generated by lens, instrument, a filter, and the like besides the scattered light and the fluorescence signal.
본 발명은 빔덤퍼 기술에 관한 것으로서, 더 상세하게는 단일 미세입자와 발광다이오드 빔이 상호작용하여 생성되는 미약한 산란광 및 형광 신호를 검출하는 장치에 적용되며 산란광 및 형광 신호 외에 렌즈, 기구, 필터 등에 의해 발생한 잡광을 감쇄하거나 제거하여 잡광이 입자계수기의 성능에 영향을 주지 않도록 하는 빔덤퍼에 대한 것이다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | BEAM DUMPER FOR MEASURING BEAM OUTPUT AND MONITORING OPTICAL ALIGNMENT AND STRAY LIGHT ATTENUATION OF PARTICLE COUNTER |
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