BEAM DUMPER FOR MEASURING BEAM OUTPUT AND MONITORING OPTICAL ALIGNMENT AND STRAY LIGHT ATTENUATION OF PARTICLE COUNTER

The present invention relates to a beam dumper technique and, more specifically, to a beam dumper which is applied to a device for detecting a faint scattered light and a fluorescence signal generated by interacting single fine particles and a light emitting diode beam, and in which the stray light...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	JEONG, YOUNG SU, CHOI, KI BONG, CHONG, EU GENE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The present invention relates to a beam dumper technique and, more specifically, to a beam dumper which is applied to a device for detecting a faint scattered light and a fluorescence signal generated by interacting single fine particles and a light emitting diode beam, and in which the stray light does not affect performance of a particle counter by attenuating and removing a stray light generated by lens, instrument, a filter, and the like besides the scattered light and the fluorescence signal. 본 발명은 빔덤퍼 기술에 관한 것으로서, 더 상세하게는 단일 미세입자와 발광다이오드 빔이 상호작용하여 생성되는 미약한 산란광 및 형광 신호를 검출하는 장치에 적용되며 산란광 및 형광 신호 외에 렌즈, 기구, 필터 등에 의해 발생한 잡광을 감쇄하거나 제거하여 잡광이 입자계수기의 성능에 영향을 주지 않도록 하는 빔덤퍼에 대한 것이다.