SYSTEM AND METHOD FOR INSPECTING A ONE CHIP MICROPROCESSOR CIRCUIT DEVICE OF POWER PLANT PCB

SYSTEM AND METHOD FOR INSPECTING A ONE CHIP MICROPROCESSOR CIRCUIT DEVICE OF POWER PLANT PCB

PURPOSE: A system and a method for inspecting a semiconductor integrated circuit of a power plant PCB are provided to prevent the unexpected operation stop of a power plant. CONSTITUTION: A system for inspecting a semiconductor integrated circuit of a power plant PCB comprises a manipulation unit(10...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YOON, DONG KIL, LEE, JI HOON, CHOI, BYOUNG YOON
Format: Patent
Sprache:eng ; kor
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator YOON, DONG KIL
LEE, JI HOON
CHOI, BYOUNG YOON
description PURPOSE: A system and a method for inspecting a semiconductor integrated circuit of a power plant PCB are provided to prevent the unexpected operation stop of a power plant. CONSTITUTION: A system for inspecting a semiconductor integrated circuit of a power plant PCB comprises a manipulation unit(10), a jig(20), a reading unit(40), a control unit(50), a memory unit(60), and a display unit(70). Conditions for inspecting a semiconductor IC are inputted to the manipulation unit. The jig detects data inputted and outputted through a lead pin. The reading unit reads the detected data and supplies the read data to the control unit. The control unit compares the supplied data with the normal I/O data of the semiconductor IC. The memory unit creates a new database using the data. The display unit outputs the inspection state and results of the semiconductor IC.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR101174856BB1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR101174856BB1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR101174856BB13</originalsourceid><addsrcrecordid>eNqNyr0KwjAQAOAuDqK-w4GzYPB3bS8Xc2hzIYmKIJQicRIt1PdHBx_A6Vu-YXGNl5iohtJpqClZ0WAkALvoCRO7HZQgjgAte6gZg_ggSDF-E3LAIyfQdGIkEANezhTAH0qXwGM1Lgb39tHnyc9RMTWU0M5y92py37W3_MzvZh_UXKnNcrtaV5Va_Lc-YoEzFw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM AND METHOD FOR INSPECTING A ONE CHIP MICROPROCESSOR CIRCUIT DEVICE OF POWER PLANT PCB</title><source>esp@cenet</source><creator>YOON, DONG KIL ; LEE, JI HOON ; CHOI, BYOUNG YOON</creator><creatorcontrib>YOON, DONG KIL ; LEE, JI HOON ; CHOI, BYOUNG YOON</creatorcontrib><description>PURPOSE: A system and a method for inspecting a semiconductor integrated circuit of a power plant PCB are provided to prevent the unexpected operation stop of a power plant. CONSTITUTION: A system for inspecting a semiconductor integrated circuit of a power plant PCB comprises a manipulation unit(10), a jig(20), a reading unit(40), a control unit(50), a memory unit(60), and a display unit(70). Conditions for inspecting a semiconductor IC are inputted to the manipulation unit. The jig detects data inputted and outputted through a lead pin. The reading unit reads the detected data and supplies the read data to the control unit. The control unit compares the supplied data with the normal I/O data of the semiconductor IC. The memory unit creates a new database using the data. The display unit outputs the inspection state and results of the semiconductor IC.</description><language>eng ; kor</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20120817&amp;DB=EPODOC&amp;CC=KR&amp;NR=101174856B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20120817&amp;DB=EPODOC&amp;CC=KR&amp;NR=101174856B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOON, DONG KIL</creatorcontrib><creatorcontrib>LEE, JI HOON</creatorcontrib><creatorcontrib>CHOI, BYOUNG YOON</creatorcontrib><title>SYSTEM AND METHOD FOR INSPECTING A ONE CHIP MICROPROCESSOR CIRCUIT DEVICE OF POWER PLANT PCB</title><description>PURPOSE: A system and a method for inspecting a semiconductor integrated circuit of a power plant PCB are provided to prevent the unexpected operation stop of a power plant. CONSTITUTION: A system for inspecting a semiconductor integrated circuit of a power plant PCB comprises a manipulation unit(10), a jig(20), a reading unit(40), a control unit(50), a memory unit(60), and a display unit(70). Conditions for inspecting a semiconductor IC are inputted to the manipulation unit. The jig detects data inputted and outputted through a lead pin. The reading unit reads the detected data and supplies the read data to the control unit. The control unit compares the supplied data with the normal I/O data of the semiconductor IC. The memory unit creates a new database using the data. The display unit outputs the inspection state and results of the semiconductor IC.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyr0KwjAQAOAuDqK-w4GzYPB3bS8Xc2hzIYmKIJQicRIt1PdHBx_A6Vu-YXGNl5iohtJpqClZ0WAkALvoCRO7HZQgjgAte6gZg_ggSDF-E3LAIyfQdGIkEANezhTAH0qXwGM1Lgb39tHnyc9RMTWU0M5y92py37W3_MzvZh_UXKnNcrtaV5Va_Lc-YoEzFw</recordid><startdate>20120817</startdate><enddate>20120817</enddate><creator>YOON, DONG KIL</creator><creator>LEE, JI HOON</creator><creator>CHOI, BYOUNG YOON</creator><scope>EVB</scope></search><sort><creationdate>20120817</creationdate><title>SYSTEM AND METHOD FOR INSPECTING A ONE CHIP MICROPROCESSOR CIRCUIT DEVICE OF POWER PLANT PCB</title><author>YOON, DONG KIL ; LEE, JI HOON ; CHOI, BYOUNG YOON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR101174856BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2012</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YOON, DONG KIL</creatorcontrib><creatorcontrib>LEE, JI HOON</creatorcontrib><creatorcontrib>CHOI, BYOUNG YOON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOON, DONG KIL</au><au>LEE, JI HOON</au><au>CHOI, BYOUNG YOON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM AND METHOD FOR INSPECTING A ONE CHIP MICROPROCESSOR CIRCUIT DEVICE OF POWER PLANT PCB</title><date>2012-08-17</date><risdate>2012</risdate><abstract>PURPOSE: A system and a method for inspecting a semiconductor integrated circuit of a power plant PCB are provided to prevent the unexpected operation stop of a power plant. CONSTITUTION: A system for inspecting a semiconductor integrated circuit of a power plant PCB comprises a manipulation unit(10), a jig(20), a reading unit(40), a control unit(50), a memory unit(60), and a display unit(70). Conditions for inspecting a semiconductor IC are inputted to the manipulation unit. The jig detects data inputted and outputted through a lead pin. The reading unit reads the detected data and supplies the read data to the control unit. The control unit compares the supplied data with the normal I/O data of the semiconductor IC. The memory unit creates a new database using the data. The display unit outputs the inspection state and results of the semiconductor IC.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; kor
recordid cdi_epo_espacenet_KR101174856BB1
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title SYSTEM AND METHOD FOR INSPECTING A ONE CHIP MICROPROCESSOR CIRCUIT DEVICE OF POWER PLANT PCB
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T04%3A48%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YOON,%20DONG%20KIL&rft.date=2012-08-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR101174856BB1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true